JAI Wave Series Cameras

The JAI Wave Series cameras are advanced SWIR line scan cameras engineered for high-speed industrial inspection where conventional visible-light imaging reaches its limits. Built with InGaAs sensor technology, the Wave Series detects short-wave infrared light across the 900–1700 nm range, helping reveal hidden material properties, moisture differences, contamination, defects, and structural variations that standard cameras may miss. Available in 1K and 2K configurations, these cameras combine high sensitivity, fast line rates, flexible grayscale output, and GigE Vision connectivity for efficient integration into machine vision systems. With prism-based dual-band imaging capabilities on select models, the Wave Series is especially valuable for food sorting, semiconductor and wafer inspection, recycling, scientific imaging, and other demanding applications requiring speed, precision, and deeper material insight.