JAI WAL-2001-GE Camera

The JAI WAL-2001-GE brings higher-resolution SWIR line scan imaging to demanding industrial inspection workflows, using pixel-shift technology to generate 2K output from a compact, large-pixel sensor design. Its 12.5 µm square pixels provide strong SWIR sensitivity and signal performance, while a maximum 40 kHz line rate supports rapid inspection across continuous production environments. With peak quantum efficiency up to 83%, GigE Vision connectivity, and advanced correction features, the WAL-2001-GE is built for applications that require speed, sensitivity, and refined defect detection, including produce sorting, wafer inspection, recycling, and high-throughput material analysis.

TECHNICAL INFORMATION:

Resolution: 2K
Resolution Technology: Pixel-shift
Line Rate: Up to 40 kHz
Sensor Type: InGaAs
Spectrum: SWIR
Spectral Response: 900–1700 nm
Sensor Width: 12.8 mm
Pixel Size: 12.5 µm x 12.5 µm
Quantum Efficiency: Up to 83% peak QE
Output Format: Mono8 / Mono10 / Mono12 / Mono14
Data Interface: GigE Vision
Camera Type: Line Scan
Lens Mount: C-mount
Image Correction: FFC, DPC, spatial correction, destripe, black level control, LUT
Gain Control: Digital gain and analog gain

Request a Quote